Plymouth Materials Characterisation Project Launch
  • Jill Craigie Cinema, Roland Levinsky Building

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The University's Plymouth Electron Microscopy Centre (PEMC) is proud to announce that from January 2018, we will have 3D capability in the shape of the first publicly-accessible Focused Ion Beam Scanning Electron Microscope (FIB-SEM) in the South West, funded by the European Regional Development Fund (ERDF).

The Plymouth Materials Characterisation Project (PMCP) will see  PEMC extend its current electron microscopy offer to businesses in Devon to include 3D electron microscopy and the opportunity to work alongside not only our technical team, but also specialist academic researchers. Thanks to ERDF, this investment in a state-of-the-art dual beam microscope means that PEMC can now image and analyse materials to construct 3D data on a nanometre scale.

Join the PEMC team, Zeiss Microscopy and Oxford Instruments, alongside our first commercial user, Plessey Semiconductors, for an evening reception to find out exactly what FIB-SEM could mean for your business; what better way to round off the week than a glass of wine and an inspiring event to set the tone for your weekend? 

Plessey Semiconductors have used the Zeiss Microscopy FIB-SEM, with stunning results; come and hear how FIB-SEM has already made a difference to the development of their new products. Prepare to be inspired to think about how your company could also make use of the extensive free support on offer, funded by ERDF.

There will also be the opportunity to see the new instrument in action, view preliminary analyses and find out what this has already meant to our first users of this new technology!

This event will be of particular interest to:

  • Devon-based companies in the sectors of advanced engineering, photonics, microelectronics, manufacturing, composites, bio-medical robotics, new energy
  • Current PEMC customers (commercial and academic) who want to understand the extended benefits of 3D electron microscopy
  • Other companies or organisations who have an interest in supporting businesses in new product development, failure analysis or quality improvement.

This event is sponsored by Zeiss Microscopy and Oxford Instruments.


There are no restrictions on places from businesses wishing to attend but registration is essential for this free event as places are limited.

Contact Claire Pearce direct to register:

Claire can also be contacted for further information.

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