JEOL
TEM 1400

Technical specification

Resolution: 0.38 nm
Magnification: 10 – 1,200,000x
Accelerating Voltage: 40 – 120 kV

Equipment specification

Camera: Gatan Orius

Sample type

TEM analysis is most commonly used for biological material.

Preparation technique

Electrons need to penetrate through the sample, so the transmitted electron signal can be collected for imaging, meaning sample thickness is limited (e.g. 50 to 250 nm for biological samples). Sample preparation techniques can be found at Sample preparation at Plymouth Electron Microscopy Centre (PEMC).