JEOL 7001 FE SEM

Technical specification of the microscope itself is below:

Resolution: 1.2 nm (@ 30 kV)
Magnification: 10 – 500,000x
Accelerating Voltage: 0.5 – 30 kV


This SEM is equipped with:

  • OI Nordlys EBSD (materials)
  • OI WAVE WDS
  • OI X-Max 50mm2 EDS
  • Deben STEM Detector, generation 5
  • Tensile test stage: Gatan Micro-test 2000